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Measuring Dielectric Properties and Surface Resistance of microwave PCBs in the K-band
The theoretical model is fully developed and the test rig is designed for the measurements of
microwave parameters of unclad and laminated dielectric substrates. The geometry of the electromagnetic
field in the resonator allows dielectric measurements with electric field component orthogonal to the sample
surface. The test rig was completely automatized for measurements of the following parameters: (i) dielectric
constant ( ε) of the dielectric substrate in the range from 2 to 10, (ii) loss tangent (tanδ) of the dielectric
substrate in the range from 10-4 to 10-2, and (iii) microwave ohmic loss at the interface between the metal
layer and the dielectric material in the range from 0.01 Ω to 0.2 Ω. Measurements for a number of
commonly-used microwave PCB materials were performed in the frequency range from 30 to 40 GHz and
over a temperature range from -50 0C to +70 0C.
Schlüsselwörter: TLY5A, thermal dependance, DK, Dielektrizitätskonstante, tan d, loss factor, Verlustfaktor, K-Band
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